Tau Wae : | SN74LVTH18646APM |
---|---|
Kaihanga / Waitohu : | N/A |
Whakaahuatanga : | IC SCAN-TEST-DEV/XCVR 64-LQFP |
RoHs Tūnga : | Whakahaerehia te kore utu / RoHS |
He Rahinga Kei te wātea | 2568 pcs |
Ngā Rauemi | |
Whakaaetanga Utu | 2.7 V ~ 3.6 V |
Pūrere Pūrere Whakarato | 64-LQFP (10x10) |
Raupapa | 74LVTH |
Packaging | Tray |
Paa / Case | 64-LQFP |
Ētahi Ingoa | 296-8703 |
Tae Mahi | -40°C ~ 85°C |
Tuhinga o mua | 18 |
Momo Tae | Surface Mount |
Taumata Whakaaro Moe (MSL) | 3 (168 Hours) |
Te Tae Kaituku Taeke | 6 Weeks |
Momo Momo | ABT Scan Test Device With Transceivers and Registers |
Whakahaere Toko Whakahaere / RoHS Tūnga | Lead free / RoHS Compliant |
Whakaahuatanga Taipitopito | ABT Scan Test Device With Transceivers and Registers IC 64-LQFP (10x10) |
Tau Wae Tuakiri | 74LVTH18646 |