Tau Wae : | SN74ABTH18652APM |
---|---|
Kaihanga / Waitohu : | N/A |
Whakaahuatanga : | IC SCAN-TEST-DEV/TXRX 64-LQFP |
RoHs Tūnga : | Whakahaerehia te kore utu / RoHS |
He Rahinga Kei te wātea | 2611 pcs |
Ngā Rauemi | |
Whakaaetanga Utu | 4.5 V ~ 5.5 V |
Pūrere Pūrere Whakarato | 64-LQFP (10x10) |
Raupapa | 74ABTH |
Packaging | Tray |
Paa / Case | 64-LQFP |
Ētahi Ingoa | 296-4137 SN74ABTH18652APMG4 SN74ABTH18652APMG4-ND |
Tae Mahi | -40°C ~ 85°C |
Tuhinga o mua | 18 |
Momo Tae | Surface Mount |
Taumata Whakaaro Moe (MSL) | 3 (168 Hours) |
Te Tae Kaituku Taeke | 6 Weeks |
Momo Momo | Scan Test Device With Transceivers And Registers |
Whakahaere Toko Whakahaere / RoHS Tūnga | Lead free / RoHS Compliant |
Whakaahuatanga Taipitopito | Scan Test Device With Transceivers And Registers IC 64-LQFP (10x10) |
Tau Wae Tuakiri | 74ABTH18652 |